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Abstract
Many materials exhibit fascinating properties due to local lattice distortions coupled to charge and spin degrees of freedom and/or reduced dimensionality. Their structural characterization by traditional crystallographic techniques is challenging. The challenge can be addressed by non-traditional techniques such as resonant total x-ray scattering. The technique combines the advantages of EXAFS in terms of chemical specificity and pair distribution function analysis in terms of ability to reveal well both short and long-range interatomic correlations, without a priori assumptions about the nature of the material’s atomic structure. In the talk, we will introduce the basics of the technique and demonstrate its advantages using examples of our recent studies on metallic nanoparticles, multiferroics, charge density wave systems and Mott insulators.
